Pranav Sudersan: Atomic Force Microscopy as a tool for surface tension measurement
- Date: Jul 6, 2022
- Speaker: Pranav Sudersan
Atomic Force Microscopy (AFM) is a powerful technique to probe surface information in the sub-micrometer length scales. Unlike an SEM, AFM can image most samples under ambient conditions without the need of vacuum or cryo conditions. In my talk, I will summarize the different ways in which AFM can be utilized to obtain a variety of information such as surface topography, mechanical properties, adhesion, etc. Finally I will introduce my work, where we developed a method to measure surface tension of microdroplets using AFM, which is otherwise not possible using conventional methods designed for bulk liquids.